UB - University at Buffalo, The State University of New York Computer Science and Engineering

CSE 552: VLSI (Very Large Scale Integration) Testing

VLSI (Very Large Scale Integration) Testing

A sequel to CSE 497/597, Introduction to VLSI Electronics, the project work for this course includes testing of the chip fabricated in 497/597. Lectures include MOS transistor fundamentals, automatic test pattern generation, design for testability, built-in test techniques, design simulation at switch and gate levels, fault simulation at behavioral levels, software tools and equipment for testing, semi-custom VLSI chips, wafer scale integration, and analog circuit test and diagnosis.

None presently available.

Ph.D.:

This course fulfills one Hardware and Networked Systems Core Course (Breadth) requirement.

M.S.:

This course fulfills one Hardware and Networked Systems Core Course (Breadth) requirement.

CSE497/597 or permission of instructor.

Course Instances
Semester Section Title Instructor Credit Hours Enrolled
Spring 2009 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 25/32
Spring 2007 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 15/30
Spring 2005 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 12/50
Spring 2004 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 23/50
Spring 2003 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 32/50
Spring 2002 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 25/27
Spring 2001 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 17/20
Spring 2000 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 10/22
Spring 1999 LEC Vlsi Testing Dr. Shambhu Upadhyaya 3 12/15
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