CSE 552: VLSI (Very Large Scale Integration) Testing
VLSI (Very Large Scale Integration) Testing
A sequel to CSE 497/597, Introduction to VLSI Electronics, the project work for this course includes testing of the chip fabricated in 497/597. Lectures include MOS transistor fundamentals, automatic test pattern generation, design for testability, built-in test techniques, design simulation at switch and gate levels, fault simulation at behavioral levels, software tools and equipment for testing, semi-custom VLSI chips, wafer scale integration, and analog circuit test and diagnosis.
None presently available.
Ph.D.:
This course fulfills one Hardware and Networked Systems Core Course requirement.
M.S.:
This course fulfills one Hardware and Networked Systems Core Course requirement.
CSE497/597 or permission of instructor.
Course Instances
| Semester | Section | Title | Instructor | Credit Hours | Enrolled |
|---|---|---|---|---|---|
| Spring 2009 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 25/32 |
| Spring 2007 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 15/30 |
| Spring 2005 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 12/50 |
| Spring 2004 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 23/50 |
| Spring 2003 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 32/50 |
| Spring 2002 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 25/27 |
| Spring 2001 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 17/20 |
| Spring 2000 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 10/22 |
| Spring 1999 | LEC | Vlsi Testing | Dr. Shambhu Upadhyaya | 3 | 12/15 |
