CSE 552: VLSI (Very Large Scale Integration) Testing
This page refers to the Spring 2005 offering of CSE 552 only. The information on this page does not necessarily apply to every offering of CSE 552.
Spring 2005
13064
VLSI (Very Large Scale Integration) Testing
A sequel to CSE 497/597, Introduction to VLSI Electronics, the project work for this course includes testing of the chip fabricated in 497/597. Lectures include MOS transistor fundamentals, automatic test pattern generation, design for testability, built-in test techniques, design simulation at switch and gate levels, fault simulation at behavioral levels, software tools and equipment for testing, semi-custom VLSI chips, wafer scale integration, and analog circuit test and diagnosis.
None presently available.
CSE497/597 or permission of instructor.
Ph.D.: This course fulfills one Hardware and Networked Systems Core Course requirement.
M.S.: This course fulfills one Hardware and Networked Systems Core Course requirement.
